ATE (Semiconductor Handler)

Memory Test Handler

  • M500HT
    M500HT
    · Maximized Productivity with 512 Parallelism
    · Accurate temperature test possible through
    · temperature control accuracy of ±1.0℃
    · Optimized Handler solution for Memory Test process
    Spec
    아이템 제품사양
    도킹 방식 (Docking Type) 수직 도킹 테스트 핸들러
    (Vertical Docking Test Handler)
  • MH7
    MH7
    · Maximized Productivity with 768 Parallelism for the Nand Flash
    · Auto Teaching using vision installed in P&P Heads
    · Higher utilization rate by reducing temperature stablization time
    Spec
    아이템 제품사양
    도킹 방식 (Docking Type) 수직 도킹 테스트 핸들러
    (Vertical Docking Test Handler)
  • MH5
    MH5
    • Factory Automation ready (OHT)
    • Exchanger Auto Teaching Vision
    • Unloading 3D Vision check
    • Auto Contact Force
    • Self-Diagnosis Program
    아이템 제품사양
    도킹 방식 (Docking Type) 수직 도킹 테스트 핸들러
    (Vertical Docking Test Handler)